• Correction for Scattering Function of X-rays in the Structural Analysis of Amorphous Inorganic Polymers
  • Park SS
  • 무정형 무기고분자의 구조해석을 위한 X선 산란함수의 수정
  • 박성수
Abstract
The objective of this work was to obtain the only coherent X-ray diffraction intensities from the amorphous SiO2, a 3-dimentional random network inorganic polymer. To correct incoherent scattering from the measured diffraction intensity, incoherent scattering intensity was subtracted theoretically when using CuKα radiation and it was eliminated experimentally with a Zr-Y balance-filter when using MoKα radiation. To correct multiple scattering computer programs were developed to estimate multiple scattering intensity obtained in the amorphous SiO2 with various X-rays. The intensity ratios of multiple scattering to single scattering in the amorphous SiO2 were 0.10∼0.16% for CuKα, 0.98∼5.87% for MoKα, and 1.88∼17.86% for AgKα radiation.

3차원 랜덤 망상구조의 무기고분자인 무정형 SiO2 시편에서 측정된 X선 회절강도로부터 정합산란강도만을 얻고자 하였다. 측정된 회절강도로부터 비정합산란을 수정하기 위하여 CuKα 빔을 사용할 때는 비정합산란강도를 이론적으로 계산하여 제하였고, MoKα 빔을 사용할 때는 Zr-Y 평형 필터에 의해 실험적으로 제거하였다. 측정된 회절강도로부터 다중산란을 수정하기 위하여 여러 종류의 X선 빔에 따라 무정형 SiO2에서 발생하는 다중산란강도를 산출해주는 컴퓨터 프로그램을 작성하였다. 무정형 SiO2의 단일산란 빔에 대한 다중산란 빔의 강도 비는 CuKα 빔에서 0.10∼0.16%, MoKα 빔에서 0.98∼5.87%와 AgKα 빔에서 1.88∼17.86%이었다.

Keywords: correction; scattering; multiple; amorphous; silica

References
  • 1. Huffman M, McMillan P, J. Non-Cryst. Solids, 76, 369 (1985)
  •  
  • 2. McMillan P, Piriou B, Couty R, J. Chem. Phys., 81, 4234 (1984)
  •  
  • 3. Bray PJ, Geissberger AE, Bucholtz F, Harris IA, J. Non-Cryst. Solids, 52, 45 (1982)
  •  
  • 4. Warren BE, J. Am. Ceram. Soc., 17, 249 (1934)
  •  
  • 5. Mozzi RL, Warren BE, J. Appl. Cryst., 2, 164 (1969)
  •  
  • 6. Sinclair RN, Wright AC, J. Non-Cryst. Solids, 57, 447 (1983)
  •  
  • 7. Freeman AJ, Phys. Rev., 12, 929 (1959)
  •  
  • 8. Short MA, Acta Crystallogr., 14, 486 (1961)
  •  
  • 9. Warren BE, Mavel G, Rev. Sci. Instrum., 36, 196 (1965)
  •  
  • 10. Ergun S, Braun W, Fitzer E, J. Appl. Cryst., 41, 1133 (1970)
  •  
  • 11. Shimazu M, Watanabe A, J. Appl. Cryst., 7, 531 (1974)
  •  
  • 12. Chandrasekhar SRadiation Transfer, chap. IX, Clarendon Press, Oxford (1950)
  •  
  • 13. Strong SL, Kaplow R, Acta Crystallogr., 23, 38 (1967)
  •  
  • 14. Warren BE, Mozzi RL, Acta Crystallogr., 21, 459 (1966)
  •  
  • 15. Meek TTAn Energy Dispersive X-ray Diffraction Study of Vitreous Silica, Ph.D. Dissertation, Ohio State Univ. (1977)
  •  
  • 16. Dwiggins CW, Park DA, Acta Crystallogr. Sect. A, 27, 264 (1971)
  •  
  • 17. Cromer DT, Waber JT, Acta Crystallogr., 18, 104 (1965)
  •  
  • 18. Cromer DT, Acta Crystallogr., 18, 17 (1965)
  •  
  • 19. Keating DT, Rev. Sci. Instrum., 30, 725 (1959)
  •  
  • 20. Cullity BDElements of X-ray Diffraction, Addison-Wesley Publishing, Massachusetts (1978)
  •  
  • 21. Milberg ME, J. Appl. Phys., 40, 293 (1958)
  •  
  • 22. Norman N, Acta Crystallogr., 10, 370 (1957)
  •  
  • Polymer(Korea) 폴리머
  • Frequency : Bimonthly(odd)
    ISSN 0379-153X(Print)
    ISSN 2234-8077(Online)
    Abbr. Polym. Korea
  • 2024 Impact Factor : 0.6
  • Indexed in SCIE

This Article

  • 1998; 22(3): 408-415

    Published online May 25, 1998